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KMID : 0371820000320050457
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Nuclear Engineering and Technology
2000 Volume.32 No. 5 p.457 ~ p.464
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A Design of the Thickness Gauge Using the Compton Gamma-ray Backscattering
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Moon, B. S.
Kim, Y. K./Kim, J. Y./Kim, J. T./Chung, C. E./Hong, S. B.
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Abstract
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thickness gauge;gamma-ray backscattering;EGS4 simulation;scattered photon spectrum;plastic film and Al foil
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KEYWORD
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